Date of patent : March 5th, 2024
Patent number : 11921156-B2
Inventors : Lucas Soldano, San Jose CA (US); Jing Yang, Singapore (SG); Yong Meng Lee, San Jose (US); Suresh Venkatesan, San Jose CA (US)
Title : Structure and method for testing of PIC with an upturned mirror
https://ppubs.uspto.gov/dirsearch-public/print/downloadPdf/11921156